First, here's the experimental setup that gave the measurements I'm about to show. The StackShot is horizontal, with a heavy lens hung off the front of the camera so as to put a lot of torque on the carriage rails -- not recommended practice but good for stressing the system a bit. Taped to the lens is a chunk of paper laser-printed with small dots that get used for position tracking. Watching the paper is another camera, set up with a 50X objective to make the paper movements easy to track.

To make the measurement, I set up the StackShot controller in Dist/Step mode with an increment of 1 "step" (actually 1 microstep) and 4 seconds settling time, then shot a sequence of 195 frames. I did this twice, once with High Precision turned OFF, and again with it ON. No other differences. Then I pulled the images into Zerene Stacker and used the Align All function as described HERE to extract positioning numbers.
Here are the results:

As you can see, the StackShot with High Precision OFF is prone to periodic big jumps every 16 microsteps (7.936 microns), with an especially large one every 32 microsteps (15.872 microns).
With High Precision ON, that pattern is not completely suppressed, but it's cut way down. In this run, the largest single microstep is 1.38 microns versus 0.496 microns average, and the largest double microstep is 2.06 microns versus 0.992 microns average.
So, for high magnification work such as 40X or 50X, what I do is to set a nominal step size of 1 micron (2 microsteps), knowing this means that most of the time I'll get a little less than 1 micron and once in a while I'll get a hair over 2 microns. This is sufficient to avoid focus banding while still getting good rendition as illustrated at http://www.photomacrography.net/forum/v ... 997#103997.
I hope this bit of arcania is helpful to somebody else besides me.
--Rik