Tip-enhanced Raman spectroscopy (TERS) can achieve true nanometric spatial resolution in optical microscopy.
Because of uncontrolled drifts, atomic force microscopy (AFM)-based TERS system measurements
must be completed typically within 30 minutes to avoid unacceptable optical signal deterioration.
This measurement time limitation prevents nanoimaging large-sized (micrometer) samples.
A homebuilt feedback system to compensate possible drift in all three dimensions is described in this article.
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