Scanning Electron Microscopy Images

[flyer2o12]

Check now!

[Charles Krebs]

Amazing!!

[Chris S.]

Karl,

As usual with your SEM images, these are exquisite.

With the herb Robert, the point of X and Y compositing seems obvious (stitching), but Z compositing (stacking?) does not. I have no experience with SEM, but thought the depth of field was more than sufficient so that no stacking would be required for a subject like this. Would you mind helping me understand?

--Chris

[flyer2o12]

Karl,

As usual with your SEM images, these are exquisite.

With the herb Robert, the point of X and Y compositing seems obvious (stitching), but Z compositing (stacking?) does not. I have no experience with SEM, but thought the depth of field was more than sufficient so that no stacking would be required for a subject like this. Would you mind helping me understand?

--Chris

Thanks guys.

Yes, the depth of field (DOF) can be controlled by varying the working distance (WD). The larger the WD, the greater the DOF will be. But, increasing the WD results in a loss of resolution. So I kept an optimum balance between the two. Although the instrument still maintained a a fairly deep DOF, I still had to focus deeper into the sample to pick up pollen grains in the background.
Even at the highest WD which is 35 mm on this instrument, the DOF is not large enough to encompass the whole depth of the Herb Robert.

[Chris S.]

Thanks Karl. Very helpful explanation!

--Chris